JEOL NeoScope JCM 7000 Bench Top SEM
The JCM-7000 Benchtop Scanning Electron Microscope is designed based on a key concept of “Easy-to-use SEM with seamless navigation and live analysis”. The JCM-7000 incorporates three innovative functions; “Zeromag” for smooth transition from optical to SEM imaging, “Live Analysis” for finding constituent elements for an image observation area, and “Live 3D” for displaying a reconstructed live 3D image during SEM observation.
JEOL NeoScope JCM 6000 plus Bench Top SEM
The JCM-6000Plus has been further enhanced with a high-sensitivity backscattered electron detector providing high quality images, achieving a high end and high performance benchtop scanning electron microscope.
JEOL NeoScope JCM 6000 Bench Top SEM
The JEOL NeoScope benchtop SEM is a system design to complement both conventional optical microscopes and Scanning Electron Microscopes (SEM) in the lab. The compact system is very user friendly and has a powerful electron optics with up to a magnification of 60,000X!
Nikon Neoscope JCM 5000 Bench Top SEM
Now being replaced by the JEOL JCM 6000, the older version JCM 5000 has a magnification of upto 40,000x. This system is a good complement to the conventional optical microscopes and the SEM.