Park Systems FX10 Atomic Force Microscope
Overview
For independent researchers and user facilities alike, the Park NX10 AFM is an affordable, yet versatile platform that provides ease of use with high-resolution capabilities. The instrument is designed to produce images that are inherently distortion-free and reproducible. The Park NX10’s easy tip exchange combined with SmartScan software’s one-click imaging and pre-programmed advanced modes make Park AFMs stand out. By combining topographical imaging with the material characterization of electrical, magnetic, thermal, and mechanical properties at the nanoscale, the Park NX10 is the premier choice for cutting-edge materials science research.
Key Features:
Unparalleled Accuracy and High-resolution Imaging with Industry-leading Low-noise
Comprehensive range of AFM modes for Diverse Applications
Flexible Open-Access, Customizable for Cooperating with Various Research Environments
Built for Electrochemical Analysis
Unparalleled Accuracy and High-resolution Imaging with Industry-leading Low-noise
Park NX10 produces data you can trust, replicate, and publish at the highest nano resolution. It is equipped with the most effective low-noise Z detectors in the field, with a noise of 0.02 nm over a large bandwidth. This produces highly accurate sample topography and no edge overshoot.
Comprehensive range of AFM modes for Diverse Applications
The Park NX10 is meticulously crafted to address the demands of diverse metrology and analysis applications. It stands out with its comprehensive range of modes, presenting an extensive toolkit for researchers across various fields. From standard imaging to electrochemical analysis, the instrument seamlessly supports a multitude of AFM modes, showcasing its adaptability to a wide array of applications. With the Park NX10, researchers can confidently explore and delve into their scientific inquiries, benefiting from a versatile and reliable tool that enhances the precision and efficiency of their work.
Flexible Open-Access, Customizable for Cooperating with Various Research Environments
Park NX10 allows users to effortlessly tailor settings for their unique research environments, by offering a diverse range of options and accessories that make it seamlessly adapt to them: optimized options for thermal and chemical properties, etc.
Built for Electrochemical Analysis
Park NX10 is designed to address a wide spectrum of research and analysis applications, with particular optimization for electrochemical properties. This cutting-edge instrument offers a range of optional modes tailored for diverse functionalities in electrochemical analysis. With tailored functionalities for each mode, it provides a comprehensive suite of capabilities to meet the diverse needs of scientific exploration and analysis in electrochemistry.
Auto Probe Exchange
With Automated Probe Exchange, you can now replace old probes easily and safely in full automation. Harnessing the convenience of an 8-probe cassette, along with a magnetic controlled mechanism, the Park FX40 autonomously mounts the probes.
Decoupled XY and Z Scanners
The fundamental difference Park and its closest competitor is in the scanner architecture. Park’s unique flexure based independent XY scanner and Z scanner design allows unmatched data accuracy in nano resolution in the industry.
Industry Leading Low Noise Z Detector
Park AFMs are equipped with the most effective low noise Z detectors in the field, with a noise of 0.02 nm over large bandwidth. This produces highly accurate topography and no edge overshoot. Just one of many ways Park AFM saves you times and gives you better data.
True Non-Contact Mode
True Non-Contact Mode is a scan mode unique to Park AFM systems that produces high resolution and accurate data by preventing destructive tip-sample interaction during a scan.