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InfraRed Microscopy Inspection

Nikon-LV100ND-microscope
Semiconductor InfraRed Microscopy Inspection
InfraRed (IR) microscopic inspection is normally carried out for silicon wafer when the structure that needs to be inspected is embedded beneath a layer of silicon. As silicon is transparent under infra red. We can see through the silicon to see the structure in using IR. This make the structure that is otherwise impossible to see clearly visible and thus various inspection can be carried out. This method of inspection are widely used in MEMS production where semiconductor wafers are very often bonded together.
 
 
5X LU Plan Fluor
Inspecting wafer back side from underneath of IC package
LU Plan ELWD 50X
Inspecting wafer back side from underneath of IC package with 500x magnification

OUR PHILOSOPHY

Always go the extra mile for you” –  this is our way of life. We don’t just say it. We live by it and show you by our action! Although we may not solve all your problems all the time, we will always go the extra mile to help you!

RIGHT SYSTEM FOR THE RIGHT APPLICATION

Before order is placed, the application of the customer is discussed in detail. Base on our vast experience in various industries, we will offer the best and most cost effective solution for that application of the customer.

ON TIME DELIVERY WITH BEST QUALITY ASSURED

Complex instruments delivery may some times be long. However, we strive to ensure that we deliver the systems on time every time and with the utmost quality of the product assured!

GREAT AFTER SALES AND SERVICE

From installation to user application training to after sales services and support. We strive to ensure that every part of this is done by the best qualified engineers in a timely and professional way.