Overview
With the JCM-6000’s highly regarded touch panel operating enviromment, the JCM-6000Plus has been further enhanced with a high sensitivity backscattered electron detector providing high quality images, achieving a high end, high performance benchtop scanning electron microscope that is entirely user friendly.
 

Specifications
 
Magnification: Secondary electron image: x10 to x60,000 Backscattered image: x10 to x30,000 (when image size is 128mm x 96mm)
Imaging mode: Secondary electron image, Backscattered electron image
Accelerating Voltage: 5kV, 10kV, 15kV (3 stages), Back scattered 10kV, 15kV (2 stages)
Electron gun: Small gun with cartridge filament integrating wehnelt
bias current: auto bias
Condenser lens: Two stage electromagnetic zoom condenser lens
Objective lens: Electromagnetic lens
Auto magnification correction: Magnification corrected with reference to sample height (7mm, WD 56 to 53 mm, WD10)
Preset magnification: 6 levels, user programmable
Specimen stage: Manual control for Xand Y: X: 35mm, Y: 35mm
Max specimen size: 70mm diameter x 50 mm height
Specimen exchange: Draw-out mechanism